Laser,Micrometer,Non,Contact,Dimensional,Gauging,Systems,Flaw,Detectors

Laser Micrometer
Non Contact Dimensional Gauging Systems & Flaw Detectors

• Ranges 0.02 to 90 mm
• single & multiple heads
• high resolution 0.0001mm
• 400 scans / sec.

Takikawa offers an extensive range of Non-Contact Dimensional Gauging Systems and Flaw Detectors, for a wide range of Manufacturing Process applications.

The wide selection of sensor heads , attached, separate and multi-axis in conjunction with the single or multi-channel controllers provide for a high degree of flexibility in the configuring of systems.
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Laser Micrometer Non-Contact Dimensional Gauging Systems And Flaw Detectors